![]() Almost 95% of the TOF-PAES signal emerges from the topmost layer of the sample due to the trapping of positrons in an image-potential-well before annihilation. Time of flight- positron annihilation induced Auger electron spectroscopy (TOF-PAES) is a surface analysis technique with high surface selectivity. Joglekar, Prasad Shastry, Karthik Kalaskar, Sushant Satyal, Suman Lim, L. The broadening observed in the simulated TOF spectra was found to be consistent with that observed in the experimental secondary electron spectra of Cu generated as a result of positrons incident with energy 1.5 eV to 901 eV, when a timing resolution of 2.3 ns was assumed.Ĭomplete elimination of the secondary electron background in Auger spectra using Time of Flight Positron Annihilation Induced Auger Electron Spectroscopy The simulated TOF distribution was convolved with a Gaussian timing resolution function and compared to the experimental distribution. We have used SIMION® 8.1 to calculate the times of flight spectra of electrons leaving the sample surface with energies and angles dispersed according to distribution functions chosen to model the positron induced electron emission process and have thus obtained an estimate of the true electron energy distribution. The time of flight (TOF) spectrometer measures the energy of electrons emitted from the surface of a sample as a result of the interaction of low energy positrons with the sample surface. In this paper, we present results of numerical modelling of the University of Texas at Arlington’s time of flight positron annihilation induced Auger electron spectrometer (UTA TOF-PAES) using SIMION® 8.1 Ion and Electron Optics Simulator. ![]() Modelling the line shape of very low energy peaks of positron beam induced secondary electrons measured using a time of flight spectrometerįairchild, A.
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